AFM-IR combines atomic force microscopy with infrared spectroscopy to record chemical information at the nanoscale — far below the diffraction limit of conventional IR microscopy.

This site collects practical information about the technique: how it works, what to watch out for when interpreting data, key papers, software and labs.

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  • The technique — how AFM-IR works, measurement modes and common pitfalls
  • Key papers — foundational and recent literature
  • Software — tools for acquiring and processing AFM-IR data
  • TAPIR — free software for AFM-IR and IR microscopy data processing
  • Labs — where AFM-IR measurements can be done